- •1 Summary of Features
- •2 General Device Information
- •2.1 Pin Configuration and Definition
- •3 Functional Description
- •3.1 Memory Subsystem and Organization
- •3.2 External Bus Controller
- •3.3 Central Processing Unit (CPU)
- •3.4 Interrupt System
- •3.6 Capture/Compare Unit (CAPCOM2)
- •3.7 Capture/Compare Units CCU6x
- •3.8 General Purpose Timer (GPT12E) Unit
- •3.9 Real Time Clock
- •3.10 A/D Converters
- •3.11 Universal Serial Interface Channel Modules (USIC)
- •3.12 MultiCAN Module
- •3.13 Watchdog Timer
- •3.14 Clock Generation
- •3.15 Parallel Ports
- •3.16 Instruction Set Summary
- •4 Electrical Parameters
- •4.1 General Parameters
- •4.2 DC Parameters
- •4.2.1 DC Parameters for Upper Voltage Area
- •4.2.2 DC Parameters for Lower Voltage Area
- •4.2.3 Power Consumption
- •4.3 Analog/Digital Converter Parameters
- •4.4 System Parameters
- •4.5 Flash Memory Parameters
- •4.6 AC Parameters
- •4.6.1 Testing Waveforms
- •4.6.2 Definition of Internal Timing
- •4.6.3 External Clock Input Parameters
- •4.6.4 External Bus Timing
- •4.6.5 Synchronous Serial Interface Timing
- •4.6.6 JTAG Interface Timing
- •5 Package and Reliability
- •5.1 Packaging
- •5.2 Thermal Considerations
XE167x
XE166 Family Derivatives
Electrical Parameters
4.5Flash Memory Parameters
The XE167 is delivered with all Flash sectors erased and with no protection installed.
The data retention time of the XE167’s Flash memory (i.e. the time after which stored data can still be retrieved) depends on the number of times the Flash memory has been erased and programmed.
Note: These parameters are not subject to production test but verified by design and/or characterization.
Table 23 |
Flash Characteristics |
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(Operating Conditions apply) |
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Parameter |
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Symbol |
Limit Values |
Unit |
Note / Test |
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Condition |
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Min. |
Typ. |
Max. |
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Programming time per |
tPR |
– |
31) |
3.5 |
ms |
ms |
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128-byte page |
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Erase time per |
tER |
– |
41) |
5 |
ms |
ms |
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sector/page |
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Data retention time |
tRET |
20 |
– |
– |
years |
1,000 erase / |
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program |
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cycles |
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Flash erase endurance for |
NER |
15,000 |
– |
– |
cycles |
Data retention |
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user sectors2) |
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time 5 years |
Flash erase endurance for |
NSEC |
10 |
– |
– |
cycles |
Data retention |
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security pages |
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time 20 years |
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Drain disturb limit |
NDD |
64 |
– |
– |
cycles |
3) |
1)Programming and erase times depend on the internal Flash clock source. The control state machine needs a few system clock cycles. This requirement is only relevant for extremely low system frequencies.
In the XE167 erased areas must be programmed completely (with actual code/data or dummy values) before that area is read.
2)A maximum of 64 Flash sectors can be cycled 15,000 times. For all other sectors the limit is 1,000 cycles.
3)This parameter limits the number of subsequent programming operations within a physical sector. The drain disturb limit is applicable if wordline erase is used repeatedly. For normal sector erase/program cycles this limit will not be violated.
Access to the XE167 Flash modules is controlled by the IMB. Built-in prefetch mechanisms optimize the performance for sequential access.
Flash access waitstates only affect non-sequential access. Due to prefetch mechanisms, the performance for sequential access (depending on the software structure) is only partially influenced by waitstates.
Data Sheet |
91 |
V2.1, 2008-08 |
XE167x
XE166 Family Derivatives
Electrical Parameters
Table 24 |
Flash Access Waitstates |
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Required Waitstates |
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System Frequency Range |
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4 WS (WSFLASH = 100B) |
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fSYS ≤ fSYSmax |
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3 WS (WSFLASH = 011B) |
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fSYS ≤ 17 MHz |
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2 WS (WSFLASH = 010B) |
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fSYS ≤ 13 MHz |
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1 WS (WSFLASH = 001B) |
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fSYS ≤ 8 MHz |
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0 WS (WSFLASH = 000B) |
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Forbidden! Must not be selected! |
Note: The maximum achievable system frequency is limited by the properties of the respective derivative.
Data Sheet |
92 |
V2.1, 2008-08 |